Vasiliev B., et al. Reliability and efficiency of electronic devices. In Russian /Vasilev B., i dr. Nadenost i effektivnost radioelektronnykh ustroystv. M Sov.radio 1964. 366s. You are welcome to reach out to us for a detailed description of the copies currently available. Delivery of this book may take longer than usual including extended processing and pre-shipping time, no expedited shipping is available. Please advise us if you have a set date or a deadline to receive your order.SKUalb58832b109ea60190
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