In Russian. Rakov, Alexander Vasilievich. Spectrophotometry of thin-film semiconductor structures. Moscow: Sov. radio, 1975. Spektrofotometriya tonkoplenochnykh poluprovodnikovykh struktur. In Russian /Spectrophotometry of thin-film semiconductor structures. All images are for identification of editions only. Several books of the same edition may be available. Please feel free to request photos of available books. SKU6968032